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Development of NEMO 3-D numerical surface treatment for finite-extent semiconductor nanostructures.

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dc.contributor.author Klimeck, Gerhard
dc.contributor.author Lee, Seungwon
dc.contributor.author Oyafuso, Fabiano
dc.contributor.author Boykin, Timothy B.
dc.contributor.author Bowen, Chris R.
dc.contributor.author von Allmen, Paul
dc.date.accessioned 2006-04-12T18:22:37Z
dc.date.available 2006-04-12T18:22:37Z
dc.date.issued 2003-10-16
dc.identifier.citation 14th Workshop on Modeling and Simulation of Electronic Devices, Barcelona, Spain, October 16, 2003. en
dc.identifier.clearanceno 03-2458
dc.identifier.uri http://hdl.handle.net/2014/39104
dc.description.sponsorship NASA/JPL en
dc.format.extent 5825852 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003. en
dc.subject boundary condition en
dc.subject electronic structures en
dc.subject empirical tight binding en
dc.title Development of NEMO 3-D numerical surface treatment for finite-extent semiconductor nanostructures. en
dc.type Presentation en


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