SIM astrometric demonstration at the 150 picometer level using the MAM testbed
Goullioud, Renaud; Akopyan, Shake; An, Xin; Azevedo, Steve; Bell, Charlie; Bloemhof, Eric; Catanzarite, Joe; Cox, Brian; Deck, Mike; Dew, Sharon; Eychaner, Glenn; Gursel, Yekta; Hines, Brad; Holmes, Buck; Irigoyen, Bob; Irwin, Phil; Kruid, Ron; Lapiez, Dennis; Neat, Greg; Pan, Xiaopei; Park, Sung; Regehr, Martin; Savedra, Raymond; Shao, Mike; Shaw, John; Shae, James; Shen, Janice; Shupe, Jason; Yu, Jeff; Zhao, Feng; Zimmer, Robert
Date:
2003-08-15
Keywords:
interferometry; SIM; picometers; metrology; astrometry
Publisher:
Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003.
Citation:
IEEE Aerospace Conference, Big Sky Montana, August 15, 2003.
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