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Field emission testing of carbon nanotubes for THz frequency vacuum microwave tube sources

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dc.contributor.author Monahara, Harish
dc.contributor.author Dang, Wen Lien
dc.contributor.author Siegel, Peter H.
dc.contributor.author Hoenk, Michael
dc.contributor.author Husain, Ali
dc.contributor.author Scherer, Axel
dc.date.accessioned 2006-02-14T16:13:08Z
dc.date.available 2006-02-14T16:13:08Z
dc.date.issued 2004-01
dc.identifier.citation SPIE Micromachining and Microfabrication: MF02 Reliability, Testing, and Characterization: Photonics West 2004, San Jose, CA, January 25-29, 2004 en
dc.identifier.clearanceno 03-2975
dc.identifier.uri http://hdl.handle.net/2014/38672
dc.description.abstract A carbon nanotube-based high current density electron field emission source is under development at Jet Propulsion Laboratory (JPL) for submillimeter-wave power generation. en
dc.description.sponsorship NASA en
dc.format.extent 3383330 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003. en
dc.subject nanotubes en
dc.subject field emission en
dc.subject SWNTs en
dc.subject MWNTs en
dc.subject electrons en
dc.title Field emission testing of carbon nanotubes for THz frequency vacuum microwave tube sources en
dc.type Preprint en


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