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Single-event upsets in highly scaled commercial SOI microprocessor

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dc.contributor.author Irom, Farokh
dc.contributor.author Farmanesh, Farhad
dc.date.accessioned 2006-02-08T20:29:45Z
dc.date.available 2006-02-08T20:29:45Z
dc.date.issued 2004-04-27
dc.identifier.citation Single Event Effect Symposium, Manhattan Beach, CA, April 27-29, 2004 en
dc.identifier.clearanceno 04-1232
dc.identifier.uri http://hdl.handle.net/2014/38452
dc.description.sponsorship NASA/JPL en
dc.format.extent 824214 bytes
dc.format.mimetype application/pdf
dc.language.iso en en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2005. en
dc.subject Silicon on insulators en
dc.subject power pc en
dc.title Single-event upsets in highly scaled commercial SOI microprocessor en
dc.type Presentation en


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