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Signal processing for order 10 PM accuracy displacement metrology gauges in real-world scientific applications

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dc.contributor.author Halverson, Peter C.
dc.contributor.author Loya, Frank M.
dc.date.accessioned 2006-01-25T23:17:43Z
dc.date.available 2006-01-25T23:17:43Z
dc.date.issued 2004-03-30
dc.identifier.citation International Conference on Space Optics, Toulouse, France, March 30, 2004. en
dc.identifier.clearanceno 04-0932
dc.identifier.uri http://hdl.handle.net/2014/38383
dc.description.abstract The Space Interferometry Mission (SIM), Terrestrial Planet Finder (TPF) and James Web Space Telescope (JWST) need stable, reliable distance metrology with subnanometer accuracy. en
dc.description.sponsorship NASA/JPL en
dc.format.extent 780496 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004 en
dc.subject metrology en
dc.subject interferometry en
dc.subject phase measurement en
dc.title Signal processing for order 10 PM accuracy displacement metrology gauges in real-world scientific applications en
dc.type Preprint en


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