Publisher:Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004.
Citation:IEEE Aerospace Conference, Big Sky, MT, March 6, 2004
Abstract:
This paper briefly describes the nanometer-class metrology system used in this testbed to estimate the length and orientation of the science baseline vector, which cannot be measured directly. The focus is on the mathematical inversion problem that results and its solution.