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Endurance cycling results in extreme environments

Show simple item record Guertin, S. M. Nguyen, D. N. Scheick, L. Z. 2005-11-15T20:40:48Z 2005-11-15T20:40:48Z 2003-11
dc.identifier.citation 2003 Nonvolatile Memory Technology Symposium, San Diego, CA, November 12-13, 2003 en
dc.identifier.clearanceno 03-2931
dc.description.abstract A new test bed for life testing flash memories in extreme environments is introducted. the test bed is based on a state-of-the-art development board. Since space applications often desire state-of-the-art devices, such a basis seems appropriate. Comparison of this tester to other such systems, including those with data presented here in the past is made. Limitations of different testers for varying applications are discussed. Recently developed data, using this test bed is also presented. en
dc.description.sponsorship NASA en
dc.format.extent 3687953 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2003. en
dc.subject radiation effects en
dc.subject microelectronics en
dc.subject life testing of memory en
dc.title Endurance cycling results in extreme environments en
dc.type Plan or blueprint en

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