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A chip and pixel qualification methodology on imaging sensors

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dc.contributor.author Chen, Yuan
dc.contributor.author Guertin, Steven M.
dc.contributor.author Petkov, Mihail
dc.contributor.author Nguyen, Duc N.
dc.contributor.author Novak, Frank
dc.date.accessioned 2005-11-09T20:37:36Z
dc.date.available 2005-11-09T20:37:36Z
dc.date.issued 2004-04
dc.identifier.citation IEEE International Reliability Physics Symposium, Phoenix, AZ, April 25-29, 2004 en
dc.identifier.clearanceno 04-0515
dc.identifier.uri http://hdl.handle.net/2014/37894
dc.description.abstract This paper presents a qualification methodology on imaging sensors. In addition to overall chip reliability characterization based on sensor's overall figure of merit, such as Dark Rate, Linearity, Dark Current Non-Uniformity. en
dc.description.sponsorship NASA en
dc.format.extent 490620 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US en
dc.publisher Pasadena, CA : Jet Propulsion Laboratory, National Aeronautics and Space Administration, 2004. en
dc.subject imaging sensor en
dc.subject pixel and chip reliability en
dc.title A chip and pixel qualification methodology on imaging sensors en
dc.type Preprint en


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