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Single-event upset in power-PC processors

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dc.contributor.author Irom, F. en_US
dc.contributor.author Johnston, A. H.
dc.contributor.author Swift, G. M.
dc.date.accessioned 2004-11-09T23:04:55Z
dc.date.available 2004-11-09T23:04:55Z
dc.date.issued 2002-09-19 en_US
dc.identifier.citation RADES en_US
dc.identifier.citation Italy en_US
dc.identifier.clearanceno 02-2164 en_US
dc.identifier.uri http://hdl.handle.net/2014/37187
dc.format.extent 3536038 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other processor testing single event upset en_US
dc.title Single-event upset in power-PC processors en_US


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