dc.contributor.author | Irom, F. | en_US |
dc.contributor.author | Johnston, A. H. | |
dc.contributor.author | Swift, G. M. | |
dc.date.accessioned | 2004-11-09T23:04:55Z | |
dc.date.available | 2004-11-09T23:04:55Z | |
dc.date.issued | 2002-09-19 | en_US |
dc.identifier.citation | RADES | en_US |
dc.identifier.citation | Italy | en_US |
dc.identifier.clearanceno | 02-2164 | en_US |
dc.identifier.uri | http://hdl.handle.net/2014/37187 | |
dc.format.extent | 3536038 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | processor testing single event upset | en_US |
dc.title | Single-event upset in power-PC processors | en_US |