Single-event upset in power-PC processors

dc.contributor.author	Irom, F.	en_US
dc.contributor.author	Johnston, A. H.
dc.contributor.author	Swift, G. M.
dc.date.accessioned	2004-11-09T23:04:55Z
dc.date.available	2004-11-09T23:04:55Z
dc.date.issued	2002-09-19	en_US
dc.identifier.citation	RADES	en_US
dc.identifier.citation	Italy	en_US
dc.identifier.clearanceno	02-2164	en_US
dc.identifier.uri	http://hdl.handle.net/2014/37187
dc.format.extent	3536038 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	processor testing single event upset	en_US
dc.title	Single-event upset in power-PC processors	en_US