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Radiation effects in low-dielectric-constant methyl-silsequioxane films
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| dc.contributor.author | Petkov, M. P. | en_US |
| dc.contributor.author | Lynn, K. G. | en_US |
| dc.contributor.author | Rodbell, K. P. | en_US |
| dc.contributor.author | Volksen, W. | en_US |
| dc.contributor.author | Miller, R. D. | en_US |
| dc.date.accessioned | 2004-11-09T22:46:42Z | |
| dc.date.available | 2004-11-09T22:46:42Z | |
| dc.date.issued | 2002-07-15 | en_US |
| dc.identifier.citation | The Nuclear and Space Radiation Conference | en_US |
| dc.identifier.citation | Phoenix, Arizona, USA | en_US |
| dc.identifier.clearanceno | 02-0304 | en_US |
| dc.identifier.uri | http://hdl.handle.net/2014/37088 | |
| dc.format.extent | 34380 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en_US | |
| dc.subject.other | radiation effects | en_US |
| dc.title | Radiation effects in low-dielectric-constant methyl-silsequioxane films | en_US |
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JPL TRS 1992+
JPL TRS 1992+