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TID testing of FeRAM memories

TID testing of FeRAM memories

Nguyen, D.; Scheick, O. L.
URI: http://hdl.handle.net/2014/36811
Date: 2001-07-17
Citation: IEEE Nuclear and Space Radiation Effects Conference
Vancouver, BC, Canada

Abstract:

This paper presents TID testing of 64Kb ramton FM1608 and 256Kb ramtron FM 1808.

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