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TID testing of FeRAM memories
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TID testing of FeRAM memories
Nguyen, D.
;
Scheick, O. L.
URI:
http://hdl.handle.net/2014/36811
Date:
2001-07-17
Citation:
IEEE Nuclear and Space Radiation Effects Conference
Vancouver, BC, Canada
Abstract:
This paper presents TID testing of 64Kb ramton FM1608 and 256Kb ramtron FM 1808.
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JPL TRS 1992+
JPL TRS 1992+
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