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Tailoring and Test Effectiveness

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dc.contributor.author Gindorf, T. en_US
dc.date.accessioned 2004-10-06T17:15:53Z
dc.date.available 2004-10-06T17:15:53Z
dc.date.issued 1994-10-11 en_US
dc.identifier.citation IES, Aerospace Testing Seminar en_US
dc.identifier.citation Manhattan Beach, California, USA en_US
dc.identifier.clearanceno 93-2105 en_US
dc.identifier.uri http://hdl.handle.net/2014/36628
dc.description.abstract The results of the many tests performed are often lost in the archives of individual company records. en_US
dc.format.extent 32943 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other test history yields better understanding of the testing program maximize cost effective return en_US
dc.title Tailoring and Test Effectiveness en_US


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