JPL Technical Report Server

Laser Metrology Gauges for OSI

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dc.contributor.author Gursel, Yekta en_US
dc.date.accessioned 2004-10-06T02:38:11Z
dc.date.available 2004-10-06T02:38:11Z
dc.date.issued 1993-04 en_US
dc.identifier.citation SPIE, Aerospace/Remote Sensing en_US
dc.identifier.citation Orlando, FL en_US
dc.identifier.clearanceno 93-0881 en_US
dc.identifier.uri http://hdl.handle.net/2014/35300
dc.description.abstract Heterodyne interferometers have been commercially available for many years. In addition, many versions have been built at JPL for various projects. This activity is aimed at improving the accuracy of such interferometers from the 1-30 nanometer level to the picometer level for use in the proposed OSI and SONATA missions as metrology gauges. In the null-gauge configuration, we obtained a precision of 0.6 picometers at time scales of 2,500 seconds. In the relative-gauge configuration, we obtained an accuracy of 3.5 picometers rms in vacuum at time scales of few minutes. An absolute gauge with an accuracy of 10 microns over a distance of 10 meters is under construction. en_US
dc.format.extent 822603 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.title Laser Metrology Gauges for OSI en_US


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