dc.contributor.author | Vasquez, R. | en_US |
dc.date.accessioned | 2004-10-06T01:43:44Z | |
dc.date.available | 2004-10-06T01:43:44Z | |
dc.date.issued | 1993 | en_US |
dc.identifier.citation | N/A | en_US |
dc.identifier.clearanceno | 93-0490 | en_US |
dc.identifier.uri | http://hdl.handle.net/2014/35012 | |
dc.description.abstract | N/A | en_US |
dc.format.extent | 155365 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | XPS core level valence band measurements | en_US |
dc.title | LaAIO subscript 3 (100) by XPS | en_US |