SEU/SRAM as a Process Monitor

Blaes, B.R.; Buehler, M.G.

dc.contributor.author	Blaes, B.R.	en_US
dc.contributor.author	Buehler, M.G.	en_US
dc.date.accessioned	2004-10-06T01:11:10Z
dc.date.available	2004-10-06T01:11:10Z
dc.date.issued	1993-03-22	en_US
dc.identifier.citation	Barcelona, Spain	en_US
dc.identifier.clearanceno	93-0205	en_US
dc.identifier.uri	http://hdl.handle.net/2014/34820
dc.description.abstract	The SEU/SRAM is a 4-kbit Static Random Access Memory (SRAM) designed to detect Single-Event Upsets (SEUs) produced by high energy particles. This device was used to determine the distribution in the memory cell spontaneous flip potential.	en_US
dc.format.extent	417974 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	SEU SRAM single-event upsets static random access memory cummulative distribution residual plots	en_US
dc.title	SEU/SRAM as a Process Monitor	en_US