dc.contributor.author | Blaes, B.R. | en_US |
dc.contributor.author | Buehler, M.G. | en_US |
dc.date.accessioned | 2004-10-06T01:11:10Z | |
dc.date.available | 2004-10-06T01:11:10Z | |
dc.date.issued | 1993-03-22 | en_US |
dc.identifier.citation | Barcelona, Spain | en_US |
dc.identifier.clearanceno | 93-0205 | en_US |
dc.identifier.uri | http://hdl.handle.net/2014/34820 | |
dc.description.abstract | The SEU/SRAM is a 4-kbit Static Random Access Memory (SRAM) designed to detect Single-Event Upsets (SEUs) produced by high energy particles. This device was used to determine the distribution in the memory cell spontaneous flip potential. | en_US |
dc.format.extent | 417974 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | SEU SRAM single-event upsets static random access memory cummulative distribution residual plots | en_US |
dc.title | SEU/SRAM as a Process Monitor | en_US |