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SEU/SRAM as a Process Monitor

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dc.contributor.author Blaes, B.R. en_US
dc.contributor.author Buehler, M.G. en_US
dc.date.accessioned 2004-10-06T01:11:10Z
dc.date.available 2004-10-06T01:11:10Z
dc.date.issued 1993-03-22 en_US
dc.identifier.citation Barcelona, Spain en_US
dc.identifier.clearanceno 93-0205 en_US
dc.identifier.uri http://hdl.handle.net/2014/34820
dc.description.abstract The SEU/SRAM is a 4-kbit Static Random Access Memory (SRAM) designed to detect Single-Event Upsets (SEUs) produced by high energy particles. This device was used to determine the distribution in the memory cell spontaneous flip potential. en_US
dc.format.extent 417974 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other SEU SRAM single-event upsets static random access memory cummulative distribution residual plots en_US
dc.title SEU/SRAM as a Process Monitor en_US


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