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SEU/SRAM as a Process Monitor
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SEU/SRAM as a Process Monitor
Blaes, B.R.
;
Buehler, M.G.
URI:
http://hdl.handle.net/2014/34820
Date:
1993-03-22
Citation:
Barcelona, Spain
Abstract:
The SEU/SRAM is a 4-kbit Static Random Access Memory (SRAM) designed to detect Single-Event Upsets (SEUs) produced by high energy particles. This device was used to determine the distribution in the memory cell spontaneous flip potential.
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JPL TRS 1992+
JPL TRS 1992+
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