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SEU/SRAM as a Process Monitor

SEU/SRAM as a Process Monitor

Blaes, B.R.; Buehler, M.G.
URI: http://hdl.handle.net/2014/34820
Date: 1993-03-22
Citation: Barcelona, Spain

Abstract:

The SEU/SRAM is a 4-kbit Static Random Access Memory (SRAM) designed to detect Single-Event Upsets (SEUs) produced by high energy particles. This device was used to determine the distribution in the memory cell spontaneous flip potential.

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