Decay Method for Measuring Complex Dielectric Constants During Microwave Processing

Iny, O.; Barmatz, M.

dc.contributor.author	Iny, O.	en_US
dc.contributor.author	Barmatz, M.	en_US
dc.date.accessioned	2004-10-05T21:55:41Z
dc.date.available	2004-10-05T21:55:41Z
dc.date.issued	1994--April	en_US
dc.identifier.citation	San Francisco, California, USA	en_US
dc.identifier.clearanceno	94-0585	en_US
dc.identifier.uri	http://hdl.handle.net/2014/33854
dc.description.abstract	We have developed a fast in-situ method for measuring the quality factor, Q, and resonant frequency, fr, for an isolated microwave resonant mode. The mode resonant frequency was continuously monitored using a phase modulation frequency tracking technique.	en_US
dc.format.extent	67809 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	microwave resonant frequency decay curve exponential	en_US
dc.title	Decay Method for Measuring Complex Dielectric Constants During Microwave Processing	en_US