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Decay Method for Measuring Complex Dielectric Constants During Microwave Processing

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dc.contributor.author Iny, O. en_US
dc.contributor.author Barmatz, M. en_US
dc.date.accessioned 2004-10-05T21:55:41Z
dc.date.available 2004-10-05T21:55:41Z
dc.date.issued 1994--April en_US
dc.identifier.citation San Francisco, California, USA en_US
dc.identifier.clearanceno 94-0585 en_US
dc.identifier.uri http://hdl.handle.net/2014/33854
dc.description.abstract We have developed a fast in-situ method for measuring the quality factor, Q, and resonant frequency, fr, for an isolated microwave resonant mode. The mode resonant frequency was continuously monitored using a phase modulation frequency tracking technique. en_US
dc.format.extent 67809 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other microwave resonant frequency decay curve exponential en_US
dc.title Decay Method for Measuring Complex Dielectric Constants During Microwave Processing en_US


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