JPL Technical Report Server

Decay Method for Measuring Complex Dielectric Constants During Microwave Processing

Decay Method for Measuring Complex Dielectric Constants During Microwave Processing

Iny, O.; Barmatz, M.
URI: http://hdl.handle.net/2014/33854
Date: 1994--Apri
Citation: San Francisco, California, USA

Abstract:

We have developed a fast in-situ method for measuring the quality factor, Q, and resonant frequency, fr, for an isolated microwave resonant mode. The mode resonant frequency was continuously monitored using a phase modulation frequency tracking technique.

Show full item record

Items in TRS are protected by copyright, but are furnished with U.S. government purpose use rights.

Files in this item

Thumbnail
Name: 94-0585.pdf
Size: 66.21Kb
Format: PDF
View/Open

This item appears in the following Collection(s)

Search


Browse

My Account