Optical Non-Invasive Evaluation of Ferroelectric Films/Memory Capacitors

Abstract

Non-invasive photoresponse (photocurrent/voltage, reflectance, and transmittance) from ferroelectric thin films and memory capacitors, with its strong dependence not only on the remanent polarizations, but also on the film microstructure, crystal orientation, and nature of the interfaces (state of formation/degradation, ect.) offers an excellent