Directional Reflectance Characterization Facility and

McGuckin, B.T.; Haner, D.A.; Menzies, R.T.; Esproles, C.; Brothers, A.M.

URI: http://hdl.handle.net/2014/32147

Date: 1995

Citation: Applied Optics

Abstract:

A precision reflectance characterization facility, constructed

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JPL TRS 1992+
JPL TRS 1992+

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