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Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces

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dc.contributor.author Bell, L. D. en_US
dc.contributor.author Kaiser, W. J. en_US
dc.date.accessioned 2004-10-04T20:51:53Z
dc.date.available 2004-10-04T20:51:53Z
dc.date.issued 1995
dc.identifier.citation Annual Review of Materials Science en_US
dc.identifier.clearanceno 95-1472
dc.identifier.uri http://hdl.handle.net/2014/32097
dc.description.abstract The investigation of semiconductor interfaces is complicated by their en_US
dc.format.extent 1233814 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.title Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces en_US


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