An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)

Swift, Gary

dc.contributor.author	Swift, Gary	en_US
dc.date.accessioned	2004-10-02T23:13:21Z
dc.date.available	2004-10-02T23:13:21Z
dc.date.issued	1995
dc.identifier.citation	Arachon, France	en_US
dc.identifier.clearanceno	95-0938
dc.identifier.uri	http://hdl.handle.net/2014/30349
dc.description.abstract	Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET, angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses.	en_US
dc.format.extent	507352 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	Survey of Heavy Ion	en_US
dc.title	An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)	en_US