dc.contributor.author | Swift, Gary | en_US |
dc.date.accessioned | 2004-10-02T23:13:21Z | |
dc.date.available | 2004-10-02T23:13:21Z | |
dc.date.issued | 1995 | |
dc.identifier.citation | Arachon, France | en_US |
dc.identifier.clearanceno | 95-0938 | |
dc.identifier.uri | http://hdl.handle.net/2014/30349 | |
dc.description.abstract | Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET, angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses. | en_US |
dc.format.extent | 507352 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | Survey of Heavy Ion | en_US |
dc.title | An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs) | en_US |