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An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)

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dc.contributor.author Swift, Gary en_US
dc.date.accessioned 2004-10-02T23:13:21Z
dc.date.available 2004-10-02T23:13:21Z
dc.date.issued 1995
dc.identifier.citation Arachon, France en_US
dc.identifier.clearanceno 95-0938
dc.identifier.uri http://hdl.handle.net/2014/30349
dc.description.abstract Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET, angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses. en_US
dc.format.extent 507352 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Survey of Heavy Ion en_US
dc.title An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs) en_US


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