An Experimental Survey of Heavy Ion Induced Dielectric Rupture in Actel Field Programmable Gate Arrays (FPGAs)

Abstract

Irradiations and subsequent failure analyses were performed to investigate single event dielectric rupture (SEDR) in Actel FPGAs as a function of ion LET, angle, bias, temperature, feature size, and device type. The small cross sections imply acceptably low risk for most spacecraft uses.