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Ballistic-Electron-Emission Microscopy of Strain Non-Uniformities in Si<sub>1-x</sub>Ge<sub>x</sub>/Si Structure

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dc.contributor.author Bell, L. D. en_US
dc.date.accessioned 2004-10-02T23:12:53Z
dc.date.available 2004-10-02T23:12:53Z
dc.date.issued 1995-07 en_US
dc.identifier.citation Physical Review B en_US
dc.identifier.clearanceno 95-0934 en_US
dc.identifier.uri http://hdl.handle.net/2014/30345
dc.format.extent 650474 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Ballistic Electron Emission en_US
dc.title Ballistic-Electron-Emission Microscopy of Strain Non-Uniformities in Si<sub>1-x</sub>Ge<sub>x</sub>/Si Structure en_US


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