dc.contributor.author | Vasquez, R. P. | en_US |
dc.contributor.author | Novikov, D. L. | en_US |
dc.contributor.author | Freeman, A. J. | en_US |
dc.contributor.author | Siegal, M. P. | en_US |
dc.date.accessioned | 2004-10-01T06:21:14Z | |
dc.date.available | 2004-10-01T06:21:14Z | |
dc.date.issued | 1996 | en_US |
dc.identifier.clearanceno | 96-1790 | en_US |
dc.identifier.uri | http://hdl.handle.net/2014/27718 | |
dc.description.abstract | The core levels of TIBa<sub>2</sub>CaCu<sub>2</sub>O<sub>7-delta</sub> epitaxial films have been measured with x-ray photoelectron spectroscopy (XPS). The valence electronic structure has been determined using the full-potential linear muffin tin orbital band structure method and measured with XPS. | en_US |
dc.format.extent | 1502238 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | Epitaxial films van Hove Fermi level | en_US |
dc.title | Electronic Structure of TIBa<sub>2</sub>CaCu<sub>2</sub>O<sub>7-delta</sub> | en_US |