Electronic Structure of TIBa2CaCu2O7-delta

Vasquez, R. P.; Novikov, D. L.; Freeman, A. J.; Siegal, M. P.

dc.contributor.author	Vasquez, R. P.	en_US
dc.contributor.author	Novikov, D. L.	en_US
dc.contributor.author	Freeman, A. J.	en_US
dc.contributor.author	Siegal, M. P.	en_US
dc.date.accessioned	2004-10-01T06:21:14Z
dc.date.available	2004-10-01T06:21:14Z
dc.date.issued	1996	en_US
dc.identifier.clearanceno	96-1790	en_US
dc.identifier.uri	http://hdl.handle.net/2014/27718
dc.description.abstract	The core levels of TIBa<sub>2</sub>CaCu<sub>2</sub>O<sub>7-delta</sub> epitaxial films have been measured with x-ray photoelectron spectroscopy (XPS). The valence electronic structure has been determined using the full-potential linear muffin tin orbital band structure method and measured with XPS.	en_US
dc.format.extent	1502238 bytes
dc.format.mimetype	application/pdf
dc.language.iso	en_US
dc.subject.other	Epitaxial films van Hove Fermi level	en_US
dc.title	Electronic Structure of TIBa<sub>2</sub>CaCu<sub>2</sub>O<sub>7-delta</sub>	en_US