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Metrology for Spatial Interferometry III

Show simple item record Gürsel, Yekta en_US 2004-09-30T23:07:17Z 2004-09-30T23:07:17Z 1996-08-03 en_US
dc.identifier.citation Denver, CO en_US
dc.identifier.clearanceno 96-1229 en_US
dc.description.abstract Very high resolution spatial interferometry requires picometer level one-dimensional metrology, surface metrology, and 3-dimensional metrology. The absolute distance measurements with accuracies of only 1 part in a million are required due to the careful design of spacecraft like the proposed Stellar Interferometry Mission (SIM), carrying high resolution stellar interferometers. An absolute calibration system for the surface gauge described in a previous paper is demonstrated. A self-calibrating absolute metrology system with a repeatability of 2 microns rms over a one-way distance of a meter is demonstrated. The accuracy calibration of this gauge is in progress. An auto-aligning, 3-dimensional metrology gauge is constructed using the sub-picometer linear metrology gauge described in earlier papers. Initial test results from this demonstration are presented. en_US
dc.format.extent 1636155 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other high resolution spatial interferometry metrology absolute distance measurement Stellar Interferometry Mission stellar interferometers en_US
dc.title Metrology for Spatial Interferometry III en_US

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