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Enhanced Damage in Bipolar Devices at Low Dose Rates: Effects at Very Low Dose Rates*
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Enhanced Damage in Bipolar Devices at Low Dose Rates: Effects at Very Low Dose Rates*
Johnston, A. H.
;
Lee, C. I.
;
Rax, B. G.
URI:
http://hdl.handle.net/2014/26075
Date:
1996-07-15
Citation:
Indian Wells, California, USA
Abstract:
The effect of very low dose rates and equivalence of high-temperature irradiation are investigated for several device types that are sensitive to enhanced low dose-rate damage. New results are included at 0.001 rad(si)/s.
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JPL TRS 1992+
JPL TRS 1992+
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