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Enhanced Damage in Bipolar Devices at Low Dose Rates: Effects at Very Low Dose Rates*

Enhanced Damage in Bipolar Devices at Low Dose Rates: Effects at Very Low Dose Rates*

Johnston, A. H.; Lee, C. I.; Rax, B. G.
URI: http://hdl.handle.net/2014/26075
Date: 1996-07-15
Citation: Indian Wells, California, USA

Abstract:

The effect of very low dose rates and equivalence of high-temperature irradiation are investigated for several device types that are sensitive to enhanced low dose-rate damage. New results are included at 0.001 rad(si)/s.

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