JPL Technical Report Server

Measuring the Thickness and Elastic Properties of Electroactive Thin-Film Polymers Using Platewave Dispersion Data

Measuring the Thickness and Elastic Properties of Electroactive Thin-Film Polymers Using Platewave Dispersion Data

Bar-Cohen, Yoseph; Lih, Shyh-Shiuh; Mal, Ajit K.
URI: http://hdl.handle.net/2014/25242
Date: 1996-07-28
Citation: Brunswick, Maine

Show full item record

Items in TRS are protected by copyright, but are furnished with U.S. government purpose use rights.

Files in this item

Thumbnail
Name: 96-0752.pdf
Size: 118.0Kb
Format: PDF
View/Open

This item appears in the following Collection(s)

Search


Browse

My Account