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Electronic Structure of T1<sub>2</sub>BA<sub>2</sub>CuO<sub>6+delta</sub> Epitaxial Films Measured by X-ray Photoemission
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| dc.contributor.author | Vasquez, R. P. | en_US |
| dc.contributor.author | Ren, Z. F. | en_US |
| dc.contributor.author | Wang, J. H. | en_US |
| dc.date.accessioned | 2004-09-30T05:50:27Z | |
| dc.date.available | 2004-09-30T05:50:27Z | |
| dc.date.issued | 1996 | en_US |
| dc.identifier.clearanceno | 96-0751 | en_US |
| dc.identifier.uri | http://hdl.handle.net/2014/25241 | |
| dc.description.abstract | In summary, the valence electronic structure and core levels of T1-2201 epitaxial films have been measured in this work with XPS. | en_US |
| dc.format.extent | 384133 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en_US | |
| dc.subject.other | superconducting cuprates transition temperatures photoemission studies | en_US |
| dc.title | Electronic Structure of T1<sub>2</sub>BA<sub>2</sub>CuO<sub>6+delta</sub> Epitaxial Films Measured by X-ray Photoemission | en_US |
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JPL TRS 1992+
JPL TRS 1992+