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Cost Effective Assessment of System Reliability Using Data From Subsystem/Assembly Level Testing
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Cost Effective Assessment of System Reliability Using Data From Subsystem/Assembly Level Testing
Krasich, Millena
URI:
http://hdl.handle.net/2014/24655
Date:
1996-05-13
Citation:
Orlando, Florida, USA
Abstract:
The paper describes a simple method developed to use and combine subsystem or assembly level accelerated test results withthe system level test results to estimate achieved overall system reliability.
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JPL TRS 1992+
JPL TRS 1992+
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