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Cost Effective Assessment of System Reliability Using Data From Subsystem/Assembly Level Testing

Cost Effective Assessment of System Reliability Using Data From Subsystem/Assembly Level Testing

Krasich, Millena
URI: http://hdl.handle.net/2014/24655
Date: 1996-05-13
Citation: Orlando, Florida, USA

Abstract:

The paper describes a simple method developed to use and combine subsystem or assembly level accelerated test results withthe system level test results to estimate achieved overall system reliability.

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