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Reliability Modeling of MCMs - RELTECH Lessons Learned
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Reliability Modeling of MCMs - RELTECH Lessons Learned
Newell, James M.
;
Larson, Timothy W.
;
Gersch, Glenn
;
Stoklosa, Mark
URI:
http://hdl.handle.net/2014/24305
Date:
1996-04-17
Citation:
Denver, Colorado, USA
Abstract:
The rapid development of advanced electronic packaging and interconnect technologiew, specifically MCMs, requires effective ways of evaluating the reliability of these packages...
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JPL TRS 1992+
JPL TRS 1992+
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