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Reliability Modeling of MCMs - RELTECH Lessons Learned

Reliability Modeling of MCMs - RELTECH Lessons Learned

Newell, James M.; Larson, Timothy W.; Gersch, Glenn; Stoklosa, Mark
URI: http://hdl.handle.net/2014/24305
Date: 1996-04-17
Citation: Denver, Colorado, USA

Abstract:

The rapid development of advanced electronic packaging and interconnect technologiew, specifically MCMs, requires effective ways of evaluating the reliability of these packages...

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