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GaN Schottky Barriers Probed by BEEM Spectroscopy and Imaging

GaN Schottky Barriers Probed by BEEM Spectroscopy and Imaging

Bell, L. D.; Smith, R. P.; Gertner, E. R.; McDermott, B. T.; Pierson, R. L.; Sullivan, G. J.
URI: http://hdl.handle.net/2014/22878
Date: 1997-04-13
Citation: Materials Research Society Spring Meeting
San Francisco, California, USA

Abstract:

Among the challenges involved in the utilization of GaN and related nitrides in devices is an understanding and characterization of Schottky contacts to these materials.

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