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The Measurement of the Directional Hemispherical Reflectance From Spectralon

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dc.contributor.author Haner, D. A. en_US
dc.contributor.author McGuckin, B. T. en_US
dc.contributor.author Menzies, R. T. en_US
dc.contributor.author Bruegge, C. J. en_US
dc.contributor.author Duval, V. en_US
dc.date.accessioned 2004-09-27T17:03:27Z
dc.date.available 2004-09-27T17:03:27Z
dc.date.issued 1997-09 en_US
dc.identifier.citation USA en_US
dc.identifier.clearanceno 97-1202 en_US
dc.identifier.uri http://hdl.handle.net/2014/22681
dc.description.abstract The directional hemispheric reflecatance is measured for Spectralon, the material chosen for on-board radiometric calibration of the Multiangle Imaging SpectroRadiometer (MISR), at laser wavelengths of 442, 632.8 and 859.9nm. en_US
dc.format.extent 238165 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Spectralon Hemisphere en_US
dc.title The Measurement of the Directional Hemispherical Reflectance From Spectralon en_US


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