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The Measurement of the Directional Hemispherical Reflectance From Spectralon
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The Measurement of the Directional Hemispherical Reflectance From Spectralon
Haner, D. A.
;
McGuckin, B. T.
;
Menzies, R. T.
;
Bruegge, C. J.
;
Duval, V.
URI:
http://hdl.handle.net/2014/22681
Date:
1997-09
Citation:
USA
Abstract:
The directional hemispheric reflecatance is measured for Spectralon, the material chosen for on-board radiometric calibration of the Multiangle Imaging SpectroRadiometer (MISR), at laser wavelengths of 442, 632.8 and 859.9nm.
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JPL TRS 1992+
JPL TRS 1992+
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