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The Measurement of the Directional Hemispherical Reflectance From Spectralon

The Measurement of the Directional Hemispherical Reflectance From Spectralon

Haner, D. A.; McGuckin, B. T.; Menzies, R. T.; Bruegge, C. J.; Duval, V.
URI: http://hdl.handle.net/2014/22681
Date: 1997-09
Citation: USA

Abstract:

The directional hemispheric reflecatance is measured for Spectralon, the material chosen for on-board radiometric calibration of the Multiangle Imaging SpectroRadiometer (MISR), at laser wavelengths of 442, 632.8 and 859.9nm.

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