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Degradation of Precision Reference Devices in Space Environments

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dc.contributor.author Rax, B. G. en_US
dc.contributor.author Lee, C. I. en_US
dc.contributor.author Johnson, A. H. en_US
dc.date.accessioned 2004-09-26T01:07:12Z
dc.date.available 2004-09-26T01:07:12Z
dc.date.issued 1997-07-04 en_US
dc.identifier.citation SnowMass, Colorado, USA en_US
dc.identifier.clearanceno 97-0898 en_US
dc.identifier.uri http://hdl.handle.net/2014/22411
dc.description.abstract This paper presents radiation test results for several different precision voltage devices. Their degradation is compared to that expected for the basic bandgap reference circuit, which is used as a theoretical benchmark, and uses only npn transistorss. en_US
dc.format.extent 107375 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Precision Voltage Devices Radiation Test Result en_US
dc.title Degradation of Precision Reference Devices in Space Environments en_US


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