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Direct Detection and Imaging of Low-Energy Electrons with Delta-Doped Charge-Coupled Devices

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dc.contributor.author Nikzad, S. en_US
dc.contributor.author Yu, Q. en_US
dc.contributor.author Smith, A. L. en_US
dc.contributor.author Jones, T. J. en_US
dc.contributor.author Tombrello, T. A. en_US
dc.contributor.author Elliott, S. T. en_US
dc.date.accessioned 2004-09-25
dc.date.available 2004-09-25
dc.date.issued 1998-09 en_US
dc.identifier.citation Applied Physics Letters en_US
dc.identifier.citation USA en_US
dc.identifier.clearanceno 98-1549 en_US
dc.identifier.uri http://hdl.handle.net/2014/20552
dc.description.abstract We report the use fo delta-doped charge-coupled devices (CCDs) for direct detection of electrons in the 50-1500 eV energy range. These are the first measurements with a solid state device to detect electrons in this energy range. en_US
dc.format.extent 513075 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other imaging delta-doped charge-coupled devices CCDs low-energy electrons en_US
dc.title Direct Detection and Imaging of Low-Energy Electrons with Delta-Doped Charge-Coupled Devices en_US


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