dc.contributor.author | Nikzad, S. | en_US |
dc.contributor.author | Yu, Q. | en_US |
dc.contributor.author | Smith, A. L. | en_US |
dc.contributor.author | Jones, T. J. | en_US |
dc.contributor.author | Tombrello, T. A. | en_US |
dc.contributor.author | Elliott, S. T. | en_US |
dc.date.accessioned | 2004-09-25 | |
dc.date.available | 2004-09-25 | |
dc.date.issued | 1998-09 | en_US |
dc.identifier.citation | Applied Physics Letters | en_US |
dc.identifier.citation | USA | en_US |
dc.identifier.clearanceno | 98-1549 | en_US |
dc.identifier.uri | http://hdl.handle.net/2014/20552 | |
dc.description.abstract | We report the use fo delta-doped charge-coupled devices (CCDs) for direct detection of electrons in the 50-1500 eV energy range. These are the first measurements with a solid state device to detect electrons in this energy range. | en_US |
dc.format.extent | 513075 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | imaging delta-doped charge-coupled devices CCDs low-energy electrons | en_US |
dc.title | Direct Detection and Imaging of Low-Energy Electrons with Delta-Doped Charge-Coupled Devices | en_US |