JPL Technical Report Server

Microchannel Gate Temperature Analysis

Microchannel Gate Temperature Analysis

Kim, Q.; Kayali, S.
URI: http://hdl.handle.net/2014/20381
Date: 1998-08
Citation: Journal of Microelectronics Reliability
USA

Abstract:

Photoemission spectra of a GaAs gate material of a metal semiconductor field effect transistor (MESFET) were analyzed to nondestructively assess the submicron-size local gate temperature.

Show full item record

Items in TRS are protected by copyright, but are furnished with U.S. government purpose use rights.

Files in this item

Thumbnail
Name: 98-1325.pdf
Size: 565.0Kb
Format: PDF
View/Open

This item appears in the following Collection(s)

Search


Browse

My Account