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Compendium of Single Event Failures in Power MOSFETs

Compendium of Single Event Failures in Power MOSFETs

Coss, J. R.; Swift, G. M.; Selva, L. E.; Titus, J. L.; Normand, E.; Oberg, D. L.
URI: http://hdl.handle.net/2014/20299
Date: 1998-07-20
Citation: Nuclear & Space Radiation Effects Conference
Newport Beach, CA, U.S.A.

Abstract:

This compendium of SEGR and SEB data organizes results from several laboratories comparing failure thresholds for several different manufacturers and technologies. The results of this compendium are aimed at the designer to show the possible variations between manufacturers and processes.

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