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Deep Space 3 Metrology System

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dc.contributor.author Dubovitsky, S. en_US
dc.contributor.author Linfield, R. P. en_US
dc.contributor.author Blackwood, G. H. en_US
dc.contributor.author Gorham, P. W. en_US
dc.contributor.author Shao, M. en_US
dc.contributor.author Folkner, W. M. en_US
dc.contributor.author Yu, J. W. en_US
dc.date.accessioned 2004-09-25
dc.date.available 2004-09-25
dc.date.issued 1998-03-20 en_US
dc.identifier.citation Astronomical Telescopes & Instruments en_US
dc.identifier.citation Kona, Hawaii, U.S.A. en_US
dc.identifier.clearanceno 98-1088 en_US
dc.identifier.uri http://hdl.handle.net/2014/20205
dc.description.abstract A metrology subsystem on board the Deep Space 3, a separated interferometer mission, is used to determine stellar fringe delay jitter, delay rate, and intial delay. en_US
dc.format.extent 1264252 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Deep Space 3 interferometer stellar fringe delay jitter angular metrology linear metrology space-based stellar interferometry separated spacecraft interferometer interferometric metrology frequency modulated metrology en_US
dc.title Deep Space 3 Metrology System en_US


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