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Deep Space 3 Metrology System

Show simple item record Dubovitsky, S. en_US Linfield, R. P. en_US Blackwood, G. H. en_US Gorham, P. W. en_US Shao, M. en_US Folkner, W. M. en_US Yu, J. W. en_US 2004-09-25 2004-09-25 1998-03-20 en_US
dc.identifier.citation Astronomical Telescopes & Instruments en_US
dc.identifier.citation Kona, Hawaii, U.S.A. en_US
dc.identifier.clearanceno 98-1088 en_US
dc.description.abstract A metrology subsystem on board the Deep Space 3, a separated interferometer mission, is used to determine stellar fringe delay jitter, delay rate, and intial delay. en_US
dc.format.extent 1264252 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Deep Space 3 interferometer stellar fringe delay jitter angular metrology linear metrology space-based stellar interferometry separated spacecraft interferometer interferometric metrology frequency modulated metrology en_US
dc.title Deep Space 3 Metrology System en_US

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