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New Convex Grating Types for Concentric Imaging Spectrometers

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dc.contributor.author Mouroulis, P. en_US
dc.contributor.author Wilson, D. W. en_US
dc.contributor.author Maker, P. D. en_US
dc.contributor.author Maker, R. E. en_US
dc.contributor.author Muller, R. E. en_US
dc.date.accessioned 2004-09-24T20:31:56Z
dc.date.available 2004-09-24T20:31:56Z
dc.date.issued 1998-03 en_US
dc.identifier.citation Applied Optics en_US
dc.identifier.citation USA en_US
dc.identifier.clearanceno 98-0520 en_US
dc.identifier.uri http://hdl.handle.net/2014/19233
dc.description.abstract The properties of convex gratings fabricated by electron-beam lithography are investigated. Three grating types are shown. These gratings allow the optical designer to fully realize the considerable advantages of concentric spectrometer forms. en_US
dc.format.extent 1036207 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other spectrometers concentric imaging electron beam en_US
dc.title New Convex Grating Types for Concentric Imaging Spectrometers en_US


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