dc.contributor.author | Azizi, A. | en_US |
dc.contributor.author | Goullioud, R. | en_US |
dc.date.accessioned | 2004-09-24T17:09:40Z | |
dc.date.available | 2004-09-24T17:09:40Z | |
dc.date.issued | 2000-03-27 | en_US |
dc.identifier.citation | SPIE, International Symposium on Astronomical Telescopes and Instrumentation 2000 | en_US |
dc.identifier.citation | Munich, Germany | en_US |
dc.identifier.clearanceno | 99-1699 | en_US |
dc.identifier.uri | http://hdl.handle.net/2014/18230 | |
dc.format.extent | 46169 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en_US | |
dc.subject.other | interferometry metrology optics | en_US |
dc.title | Metrology System Design for SIM System Testbed 3 | en_US |