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NDE of Microelectronics by Real Time X-ray Imaging

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dc.contributor.author Mih, D. en_US
dc.date.accessioned 2004-09-24T16:56:08Z
dc.date.available 2004-09-24T16:56:08Z
dc.date.issued 1999-10-11 en_US
dc.identifier.citation The American Society for Nondestructive Testing en_US
dc.identifier.citation Phoenix, Arizona, USA en_US
dc.identifier.clearanceno 99-1574 en_US
dc.identifier.uri http://hdl.handle.net/2014/18113
dc.format.extent 64006 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other NDE X-ray real-time microelectronics en_US
dc.title NDE of Microelectronics by Real Time X-ray Imaging en_US


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