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Predicting Deviations in Software Quality by Using Relative Critical Value Deviation Metrics
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Predicting Deviations in Software Quality by Using Relative Critical Value Deviation Metrics
Nikora, A.
;
Schneidewind, N.
URI:
http://hdl.handle.net/2014/18056
Date:
1999-11-01
Citation:
IEEE, International Symposium on Software Reliabilty Engineering
Boca Raton, Florida, USA
Abstract:
We develop a new metric, Relative Critical Value Deviation (RCVD), for classifying and predicting software quality.
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JPL TRS 1992+
JPL TRS 1992+
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