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Transmission Electron Microscopy Study of InGaAs/GaAs Structural Evolution Near the Stranski-Krastanow Transformation
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Transmission Electron Microscopy Study of InGaAs/GaAs Structural Evolution Near the Stranski-Krastanow Transformation
Leon, R.
;
Wellman, J.
;
George, T.
URI:
http://hdl.handle.net/2014/17818
Date:
1999-04-05
Citation:
Materials Research Society Spring Meeting 1999
San Francisco, CA, USA
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JPL TRS 1992+
JPL TRS 1992+
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