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A Boundary Scan Test Vehicle for Direct Chip Attach Testing

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dc.contributor.author Parsons, H. en_US
dc.contributor.author D'Agostino, S. en_US
dc.contributor.author Arakaki, G. en_US
dc.date.accessioned 2004-09-23T23:55:39Z
dc.date.available 2004-09-23T23:55:39Z
dc.date.issued 1999-05-12 en_US
dc.identifier.citation JPL IMAPS SoCal'99 en_US
dc.identifier.citation Pasadena, CA, U.S.A. en_US
dc.identifier.clearanceno 99-0817 en_US
dc.identifier.uri http://hdl.handle.net/2014/17369
dc.format.extent 1809841 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other Direct Chip Attach Testing Scan Test Vehicle Non-Hermetic Packaging en_US
dc.title A Boundary Scan Test Vehicle for Direct Chip Attach Testing en_US


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