JPL Technical Report Server
A Boundary Scan Test Vehicle for Direct Chip Attach Testing
Login
JPL TRS Home
→
JPL Technical Report Server
→
JPL TRS 1992+
→
View Item
JavaScript is disabled for your browser. Some features of this site may not work without it.
A Boundary Scan Test Vehicle for Direct Chip Attach Testing
Parsons, H.
;
D'Agostino, S.
;
Arakaki, G.
URI:
http://hdl.handle.net/2014/17347
Date:
1999-05-12
Citation:
JPL IMAPS SoCal'99
Pasadena, CA, U.S.A.
Show full item record
Items in TRS are protected by copyright, but are furnished with U.S. government purpose use rights.
Files in this item
Name:
99-0793.pdf
Size:
45.57Kb
Format:
PDF
View/
Open
This item appears in the following Collection(s)
JPL TRS 1992+
JPL TRS 1992+
Search
Search
This Collection
Browse
All Content
Communities & Collections
By Issue Date
Authors
Titles
Subjects
This Collection
By Issue Date
Authors
Titles
Subjects
My Account
Login
Register