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Nanoanalysis of metamorphic magnetite using field ion microscopy and three-dimensional atom probe
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| dc.contributor.author | Kuhlman, K. R. | en_US |
| dc.contributor.author | Martens, R. L. | en_US |
| dc.contributor.author | Kelly, T. F. | en_US |
| dc.contributor.author | Evans, N. D. | en_US |
| dc.contributor.author | Miller, M. K. | en_US |
| dc.date.accessioned | 2004-09-23T22:07:26Z | |
| dc.date.available | 2004-09-23T22:07:26Z | |
| dc.date.issued | 2000-11-13 | en_US |
| dc.identifier.citation | 2000 Geological Society of America Annual Meeting | en_US |
| dc.identifier.citation | Reno, Nevada, U.S.A. | en_US |
| dc.identifier.clearanceno | 00-2524 | en_US |
| dc.identifier.uri | http://hdl.handle.net/2014/16469 | |
| dc.format.extent | 301473 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en_US | |
| dc.subject.other | field ion microscopy three-dimensional atom probe Magnetite nanoanalysis focused ion beam | en_US |
| dc.title | Nanoanalysis of metamorphic magnetite using field ion microscopy and three-dimensional atom probe | en_US |
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JPL TRS 1992+
JPL TRS 1992+