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Ultrastable and uniform EUV and UV detectors

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dc.contributor.author Nikzad, S. en_US
dc.contributor.author Jones, T. J. en_US
dc.contributor.author Cunningham, T. J. en_US
dc.contributor.author Deelman, P. W. en_US
dc.contributor.author Elliot, S. T. en_US
dc.date.accessioned 2004-09-23T21:44:07Z
dc.date.available 2004-09-23T21:44:07Z
dc.date.issued 2000-09-26 en_US
dc.identifier.citation 45th Annual SPIE Meeting en_US
dc.identifier.citation San Diego, California, USA en_US
dc.identifier.clearanceno 00-2085 en_US
dc.identifier.uri http://hdl.handle.net/2014/16159
dc.description.abstract In this paper we will discuss the performance of delta-doped CCDs in UV and EUV, our in-house thinning capability, bonding approaches for producing flat focal plane arrays, and in-house capabilities of directly applied antireflection coatings. en_US
dc.format.extent 757527 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other EUV UV detectors en_US
dc.title Ultrastable and uniform EUV and UV detectors en_US


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