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Ballistic-electron-emission microscopy of device materials and structures

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dc.contributor.author Bell, L. D. en_US
dc.date.accessioned 2004-09-23T21:13:46Z
dc.date.available 2004-09-23T21:13:46Z
dc.date.issued 2000-08-09 en_US
dc.identifier.citation University of Madrid Summer School on Imaging and Manipulation of Matter at the Nanometer Scale en_US
dc.identifier.citation Madrid, Spain en_US
dc.identifier.clearanceno 00-1691 en_US
dc.identifier.uri http://hdl.handle.net/2014/15901
dc.format.extent 41615 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other scanning tunneling microscopy ballistic electron emission microscopy semiconductors electron spectroscopy en_US
dc.title Ballistic-electron-emission microscopy of device materials and structures en_US


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