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Extreme temperature (-170C to + 125C) electronics for nanorover operation

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dc.contributor.author Newell, M. en_US
dc.contributor.author Buchanan, C. en_US
dc.contributor.author McCarthy, T. en_US
dc.contributor.author Cozy, S. en_US
dc.contributor.author Gregoire, T. en_US
dc.contributor.author Stern, R. en_US
dc.date.accessioned 2004-09-23T21:13:42Z
dc.date.available 2004-09-23T21:13:42Z
dc.date.issued 2000-08-08 en_US
dc.identifier.citation 2001 IEEE Aerospace Conference en_US
dc.identifier.citation Big Sky, Montana, USA en_US
dc.identifier.clearanceno 00-1690 en_US
dc.identifier.uri http://hdl.handle.net/2014/15900
dc.format.extent 26993 bytes
dc.format.mimetype application/pdf
dc.language.iso en_US
dc.subject.other CMOS extreme temperatures chip on board low power low mass low volume radiation hardened en_US
dc.title Extreme temperature (-170C to + 125C) electronics for nanorover operation en_US


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